| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which is capable of making an entry into a testing mode without using excessive terminals. SOLUTION: The semiconductor device is equipped with a first power supply terminal, a second power supply terminal, a comparison circuit which is connected to the first and the second power supply terminal and produces signals at its output terminal corresponding to a potential difference between the first power supply terminal and the second power supply terminal, and an internal circuit which is connected to the output terminal of the comparison circuit and executes a testing operation corresponding to the signals. COPYRIGHT: (C)2007,JPO&INPIT
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