Semiconductor testing apparatus and interface board

摘要

There is provided a semiconductor testing apparatus having a test head body having signal modules for processing the test signals, a plurality of connection cables electrically connected with the signal module and having connector pins at their ends, a plurality of types of connector housings for holding a plurality of connector pins, an interface plate having a plate body disposed on one face of the test head body and a plurality of connector blocks removably attached respectively to the plate body while storing a plural number of connector' housings of either type among the plurality of types and a performance board for removably holding the electronic device and for electrically connecting the plurality of connector pins to the electronic device by being attached to the interface plate.