| 摘要 |
An X-ray analysis apparatus is disclosed, in which X-rays emitted from an X-ray source are applied to a sample and a two-dimensional CCD sensor detects the X-rays diffracted by the sample. The X-ray analysis apparatus has a 2theta-rotation drive and a program. The 2theta-rotation drive moves the two-dimensional CCD sensor. The program is executed to control the motion of the CCD sensor. The 2theta-rotation drive rotates the CCD sensor around omega-axis that extends over the surface of the sample. The program synchronizes the transfer of charges in the CCD sensor with the motion of the CCD sensor driven by the 2theta-rotation drive. Hence, data items for the same diffraction angle can be accumulated in the pixels of the two-dimensional CCD sensor. This achieves high-speed and high-sensitivity in detection of diffracted X-rays.
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