| 摘要 |
PROBLEM TO BE SOLVED: To provide a workpiece inspection device which quickly, easily and stably can achieve high quality inspection of constituents, while excluding restrictions or defects in the conventional techniques. SOLUTION: This workpiece inspection device comprises conveyer for feeding components under test, mechanism for rotating the components, and probe. The conveyer contains fixtures for locating components to move components in rectilinear direction. The rotation mechanism rotates any component in the fixture with respect to the probe, and the probe indicates whether the component meets quality standard. In order to perform inspection, while the conveyer is moving the component, the probe is mounted on the stage that is made to move synchronously with the component throughout the testing area, and facilitates inspection. COPYRIGHT: (C)2007,JPO&INPIT
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