发明名称 LOW INDUCTANCE VIA STRUCTURES
摘要 In one embodiment, a method for forming a semiconductor device, comprises forming a first aperture (450) and a second aperture (452) in a first surface of the substrate (440) , the first and second apertures being coaxial; forming, in the first aperture, a first conductive path between the first surface of the substrate and a second surface of the substrate; and forming, in the second aperture, a second conductive path between the first surface of the substrate and a second surface of the substrate .
申请公布号 WO2006127988(A1) 申请公布日期 2006.11.30
申请号 WO2006US20407 申请日期 2006.05.23
申请人 INTEL CORPORATION;HECK, JOHN;MA, QING 发明人 HECK, JOHN;MA, QING
分类号 H01L21/768;H01L23/48 主分类号 H01L21/768
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