发明名称 Slug exposing-typed semiconductor package for good reliability and thermal performance
摘要 PURPOSE: A slug exposure type semiconductor package is provided to be capable of improving reliability and effectively transferring heat. CONSTITUTION: A slug exposure type semiconductor package includes a slug(310) having the first and second surface(310a,310b). At this time, a plurality of dimples and a slug groove are formed at the first surface, and a slug swaging and a rivet hole(314) are formed at the second surface. The slug exposure type semiconductor package further includes a semiconductor chip(320) for enclosing the dimples on the first surface of the slug, inner signal leads arrayed along both sides of the slug in parallel, outer signal leads continuously arrayed to the inner signal leads, a wire for electrically connecting the semiconductor chip with the inner signal leads, and an encapsulation part(340) for selectively enclosing the resultant structure. Preferably, the thickness of the slug is in the range of 0.6-0.9 mm.
申请公布号 KR100652448(B1) 申请公布日期 2006.11.30
申请号 KR20020074373 申请日期 2002.11.27
申请人 发明人
分类号 H01L23/34 主分类号 H01L23/34
代理机构 代理人
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