发明名称 SURFACE-TREATING AGENT FOR SEMICONDUCTOR SUBSTRATE AND TREATING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an agent for treating the surface of a semiconductor substrate and a method for treating the surface of the semiconductor substrate, especially an etching agent and an etching method for the semiconductor substrate by which contamination of metal impurities in the semiconductor substrate can be suppressed. SOLUTION: (1) The surface treating agent for the semiconductor substrate includes an amino polycarboxylic acid base chelating agent or its inorganic salt and alkaline metal hydroxide of 20% (W/W) or more. (2) The etching agent for the semiconductor substrate includes an amino polycarboxylic acid base chelating agent or its inorganic salt and alkaline metal hydroxide of 20% (W/W) or more. (3) In the method for treating the surface of the semiconductor substrate, the semiconductor substrate is treated by the treating agent described in (1). (4) In the method for etching the semiconductor, the semiconductor substrate is etched by the etching agent described in (2). COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006324452(A) 申请公布日期 2006.11.30
申请号 JP20050146180 申请日期 2005.05.19
申请人 WAKO PURE CHEM IND LTD 发明人 KATO TAKEHISA;KAKIZAWA MASAHIKO;HAYASHIDA KAZUYOSHI
分类号 H01L21/306;C09K13/02;C23F1/32;H01L21/304 主分类号 H01L21/306
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