| 摘要 |
A semiconductor device may include a plurality of output electrodes configured to provide electrical coupling for a respective plurality of output signals outside the semiconductor device. A signal generator may be configured to generate the plurality of output signals. In addition, a test circuit may be coupled between the signal generator and the plurality of output electrodes. The test circuit may be configured to couple each of the output signals to a respective one of the output electrodes in a first operating mode, and the test circuit may be configured to sequentially couple each one of the output signals to one of the output electrodes in a second operating mode. Related methods are also discussed.
|
