| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing system which can perform tests on dynamic characteristics by means of an IC tester. SOLUTION: The testing system, which is an improved version of a test system for performing tests on a device under test that outputs an LVDS signal, comprises the IC tester for outputting a test signal to the device under test and a transformer, to which the LVDS signal outputted by the device under test is input and which gives the IC tester a single-ended output. COPYRIGHT: (C)2007,JPO&INPIT
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