发明名称 Dual stage lithographic apparatus and device manufacturing method
摘要 The invention relates to a dual stage lithographic apparatus, wherein to substrate stages are constructed and arranged for mutual cooperation in order to perform a joint scan movement for bringing the lithographic apparatus from a first situation, wherein immersion liquid is confined between a first substrate held by the first stage of the said stages and a final element of a projection system of the apparatus, towards a second situation, wherein the said liquid is confined between a second substrate held by the second stage of the two stages and the final element, such that during the joint scan movement the liquid is essentially confined within said space with respect to the final element.
申请公布号 SG126866(A1) 申请公布日期 2006.11.29
申请号 SG20060002345 申请日期 2006.04.07
申请人 ASML NETHERLANDS B.V 发明人 BRINK VAN DEN MARINUS AART;BENSCHOP JOZEF PETRUS HENRICUS;LOOPSTRA ERIK ROELOF
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