发明名称 Means to improve center to edge uniformity of electrochemical mechanical processing of workpiece surface
摘要 An electrochemical mechanical process for electroplating or electropolishing a conductive surface of a wafer is provided. The conductive surface of the wafer is touched by a polishing surface of a compressible pad while a process solution flows through the pad and a potential difference is maintained between the conductive surface and an electrode. The pressure between the polishing surface and a central region of the conductive surface is increased by applying a shaping process to either the conductive surface or the pad.
申请公布号 US7141146(B2) 申请公布日期 2006.11.28
申请号 US20040816340 申请日期 2004.03.31
申请人 ASM NUTOOL, INC. 发明人 BOGART JEFFREY;BASOL BULENT M.
分类号 C25F3/16;B23H5/06;B23H5/08;B24B37/04;C25D7/12;C25F3/30 主分类号 C25F3/16
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