发明名称 Parameter linking system for data visualization in integrated circuit technology development
摘要 A system for presenting tester information is provided, including providing test data of a first parameter and generating a first type of visualization of the first parameter and presenting the first type of visualization of the first parameter. The system includes generating a second type of visualization of the first parameter in response to the presenting of the first type of visualization of the first parameter and presenting the second type of visualization of the first parameter.
申请公布号 US7143370(B1) 申请公布日期 2006.11.28
申请号 US20030460500 申请日期 2003.06.11
申请人 ADVANCED MICRO DEVICES, INC. 发明人 ERHARDT JEFFREY P.
分类号 G06F17/50 主分类号 G06F17/50
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