| 摘要 |
A semiconductor integrated circuit is provided to perform a direct current test of an external terminal by forming a bypass route connected with an external output terminal. Multiple input buffers(14) are for correcting the levels of signals inputted into external input terminals(11a~11n). Multiple input selectors(15a~15n) are for selectively outputting output signals of the input buffers to a first output side and a second output side, according to a normal operation and a test operation assigned by a mode signal, respectively. A logic circuit(16) performs a logical process on the basis of the output signals of the first output sides of the input selectors. A bypass circuit(18) is for transmitting the output signals of the second output sides of the input selectors. Multiple output selectors(17a~17n) selectively output an output signal of the logic circuit and an output signal of the bypass circuit according to the normal operation and the test operation assigned by the mode signal. Multiple output buffers(19a~19n) are for amplifying the output signals of the output selectors and outputting the amplified signals to external output terminals(12a~12n).
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