Built-in self test circuit for integrated circuits,申请号EP20020425519-传众专利搜索

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发明名称	Built-in self test circuit for integrated circuits
摘要
申请公布号	EP1388788(B1)	申请公布日期	2006.11.22
申请号	EP20020425519	申请日期	2002.08.08
申请人	STMICROELECTRONICS S.R.L.	发明人	BARONE, MASSIMILIANO;GRISETA, ANTONIO
分类号	G06F11/267;G01R31/3187;G06F11/27	主分类号	G06F11/267
代理机构		代理人
主权项
地址

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