发明名称 Wafer integrated rigid support ring
摘要 A shadow mask for depositing solder bumps includes additional dummy holes located adjacent holes corresponding to most of the perimeter chips of the wafer. The additional dummy provide more uniform plasma etching of contacts of the wafer, improve etching of contacts of perimeter chips, and lower contact resistance of contacts of perimeter chips. The extra holes also provide solder bumps outside the perimeter chips that can be used to support a second shadow mask for deposition of an additional material, such as tin, on the reflowed solder bumps for mounting the chips on a plastic substrate at low temperature. An improved mask to wafer alignment aid is formed from standard solder bumps. The improved alignment aid avoids damage to test probes and provides improved course alignment.
申请公布号 US7138326(B2) 申请公布日期 2006.11.21
申请号 US20030625635 申请日期 2003.07.23
申请人 INTERNATIONAL BUSINESS MACHINES CORP. 发明人 COX HARRY D.;DANIEL DAVID P.;GARDECKI LEONARD J.;GREGORITSCH, III ALBERT J.;MACHELL JULIANELLE RUTH A.;KEELER CHARLES H.;PULASKI DORIS P.;SCHAFFER MARY A.;SMITH DAVID L.;SPECHT DAVID J.;WIRSING ADOLF E.
分类号 H01L21/44;H01L21/68;H01L21/60;H01L23/485;H01L23/528;H01L23/544 主分类号 H01L21/44
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