发明名称 DEVICE FOR MEASURING DEFLECTIONS FROM FLAT SURFACE
摘要 FIELD: measuring technique. ^ SUBSTANCE: device has measuring unit which has prod, platform with through opening where measuring unit is installed. Prod is capable of touching surface to be measured and of moving at plane being perpendicular to measured surface and along direction of measurement. Platform is provided with three supports for installation. As measuring unit the linear shift detector is used, which detector has light source, illuminating two diffraction gratings. One of gratings is measuring, being tightly connected with prod, and the other one is additional grating. Detector also has photoreceivers. Supports are made of materials having low temperature expansion coefficient. Supports provide three-point installation of platform onto surface; they are disposed in vertexes of triangle in such a way that one catheter of triangle is parallel to one side of platform. ^ EFFECT: improved precision of measurement; reduced limitations in size of surface to be measured; accelerated measuring process; widened working temperature range. ^ 4 dwg
申请公布号 RU2287776(C2) 申请公布日期 2006.11.20
申请号 RU20040135396 申请日期 2004.11.24
申请人 TURUKHANO BORIS GAN'EVICH;TURUKHANO NIKULINA;DOBYRN VLADISLAV VENIAMINOVICH 发明人 TURUKHANO BORIS GAN'EVICH;TURUKHANO NIKULINA;DOBYRN VLADISLAV VENIAMINOVICH
分类号 G01B11/30 主分类号 G01B11/30
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