发明名称 |
NON-VOLATILE FERROELECTRIC MEMORY DEVICE |
摘要 |
A nonvolatile ferroelectric memory device is provided to control stably read/write operations of a nonvolatile memory cell by using the variation of a channel resistance according to a polarization state of a ferroelectric film. An insulating layer(11) is formed on a bottom word line(10). A floating channel layer(15) is formed on the insulating layer. The floating channel layer is composed of an N type channel region(12) and N type drain/source regions at both sides of the N type channel region. A ferroelectric film(16) is formed on the channel region of the floating channel layer. A word line(17) is formed on the ferroelectric film. Data read/write operations are controlled by inducing various channel resistances to the channel region in response to a polarization state of the ferroelectric film.
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申请公布号 |
KR20060117791(A) |
申请公布日期 |
2006.11.17 |
申请号 |
KR20050040334 |
申请日期 |
2005.05.13 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KANG, HEE BOK;AHN, JIN HONG |
分类号 |
H01L27/105 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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