发明名称 NON-VOLATILE FERROELECTRIC MEMORY DEVICE
摘要 A nonvolatile ferroelectric memory device is provided to control stably read/write operations of a nonvolatile memory cell by using the variation of a channel resistance according to a polarization state of a ferroelectric film. An insulating layer(11) is formed on a bottom word line(10). A floating channel layer(15) is formed on the insulating layer. The floating channel layer is composed of an N type channel region(12) and N type drain/source regions at both sides of the N type channel region. A ferroelectric film(16) is formed on the channel region of the floating channel layer. A word line(17) is formed on the ferroelectric film. Data read/write operations are controlled by inducing various channel resistances to the channel region in response to a polarization state of the ferroelectric film.
申请公布号 KR20060117791(A) 申请公布日期 2006.11.17
申请号 KR20050040334 申请日期 2005.05.13
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, HEE BOK;AHN, JIN HONG
分类号 H01L27/105 主分类号 H01L27/105
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