| 摘要 |
A topology independent calibration system 110 (TICS) within a test system includes a netlist, a path correction module 204, and a processor 122 in signal communication with the path correction module. The path correction module may include executing an S-parameter simulator and the netlist may include accessing a database of S-parameters associated with the components of the test system. The S-parameter simulator may dembed circuit components, such as transmission lines, switches and amplifiers, which is mathematically the same thing as correcting for their effects, is independent of test system topology, and may be employed at run time. Thus, by using S-parameter simulation, more accurate measurements of a device under test (DUT) are achieved without changing equations. |
