APPARATUS AND METHODS FOR MEASUREMENT OF ANALOG VOLTAGES IN AN INTEGRATED CIRCUIT

摘要

The present disclosure relates to apparatus and methods for measurement of analog voltages in an integrated circuit. In particular, the apparatus includes an on-chip digital-to-analog converter configured to receive a variable digital input code and output a corresponding analog voltage corresponding to the variable digital input code. The apparatus also includes an on-chip comparator circuit configured to receive the analog voltage output by the digital-to-analog converter and a test analog voltage as inputs and to provide an output indicating the test analog voltage. Further, the apparatus includes an on-chip logic operative to determine the test analog voltage based on the output of the comparator circuit. A corresponding method is also disclosed.