| 摘要 |
The present invention is directed to a system and method for improving transition delay fault coverage through use of augmented flip-flops (TL flops) for a broadside test approach. The TL flops use the same clock for scan and functional operation. Thus, the TL flops do not require a fast signal switching between launch and test response capture. Each of the TL flops includes additional multiplexer in front of a standard scan flop and a transition enable (TEN) signal. Moreover, only a heuristically selected subset of scan flip-flops is replaced with the TL flops and only one additional MUX per selected scan flip-flop may contribute an area overhead. Consequently, the overall chip area overhead may be minimal. The present invention may be suitable for being implemented with currently available third party ATPG.
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