发明名称 SHORT-CIRCUITING RUGGEDNESS EVALUATION DEVICE AND METHOD OF ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To provide a technology for evaluating ruggedness for a closed-circuit failure caused by whisker. SOLUTION: A pair of random numbers are generated by a random number generator 12 to determine a pair of whisker lengths. Probability generating the whisker of a division belonging to each whisker length is determined to refer a distribution table storing part 15. A short-circuiting probability simulation part 16 generates a pair of the whiskers of the whisker length and calculates short-circuiting probability being in contact with the whiskers by simulation using a prescribed expression. In addition, if both the whiskers are a half of the minimum interval or less, the short-circuiting probability is made zero without simulation. In addition, when one whisker length is the minimum interval or more, it is judged that a short circuit occurs, and probabilities generating each of the pair of the whisker lengths are multiplied to be the short-circuiting probability. Simulation is performed by only prescribed trial times, and accumulated short-circuiting probability is divided by the prescribed trial times to calculate converged short-circuiting probability. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006308506(A) 申请公布日期 2006.11.09
申请号 JP20050133813 申请日期 2005.05.02
申请人 FUJI XEROX CO LTD 发明人 ISHIHARA KAZUNORI;MIYATA MASAHIKO;YOSHIHARA TOSHIO
分类号 G01R31/04;H05K3/00 主分类号 G01R31/04
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