| 摘要 |
PROBLEM TO BE SOLVED: To supply a program code input from a single terminal to a plurality of BIST (Built-In Self Test) circuits in parallel. SOLUTION: The plurality of BIST circuits 21-24 are provided respectively corresponding to a plurality of memory blocks 11-14 having different frequencies one another. A plurality of registers 31-34 are coupled mutually so as to constitute a scan chain 30, a program code given from the outside through a common program terminal PROGA in serial is input to the scan chain 30, the program codes set to respective registers 31-34 are supplied to the corresponding BIST circuits 21-24. COPYRIGHT: (C)2007,JPO&INPIT
|
