| 摘要 |
PROBLEM TO BE SOLVED: To provide a sample for a corrected data acquisition, in which the constraints on a performance of a relative correction method can be lessened, and to provide a measured error correction method and an electronic part characteristic measuring device. SOLUTION: At least three kinds of a first sample for the corrected data acquisition are measured in a status mounting in a standard jig. At least three kinds of a second sample for the corrected data acquisition, having the same characteristic like the first sample for the corrected data acquisition, are measured in the status mounting in a test jig. From the measured results, with a premise that the first sample for the corrected data acquisition and the second sample for the corrected data acquisition are the same sample, a formula which is related between the measured value mounted in the test jig and the measured value mounted in the standard jig is decided. Measurement is performed in a state with an arbitrary electronic component 20 is mounted in the test jig 12, and by using the determined formula, a predicted value of an electrical characteristic of the electronic part which is obtained, if the electronic part is measured in the status mounting in the standard jig is computed. COPYRIGHT: (C)2007,JPO&INPIT
|
