发明名称 |
LAMINATED STRUCTURE, ITS FORMATION METHOD, AND SEMICONDUCTOR ELEMENT |
摘要 |
<P>PROBLEM TO BE SOLVED: To form a group III nitride semiconductor layer on a boron phosphide-based semiconductor layer stably, by solving a problem of instable junction which may be caused by a difference of mutual junction when the group III nitride semiconductor layer is jointed onto the boron phosphide system semiconductor layer. <P>SOLUTION: The laminated structure body 10 includes a substrate 100 made of crystal, a boron phosphide-based group III-V compound semiconductor layer 101 arranged on the substrate 100, and a group III nitride semiconductor layer 102 jointed onto the surface of the boron phosphide-based group III-V compound semiconductor layer 101. The group III nitride semiconductor layer 102 is jointed to the boron phosphide-based group III-V compound semiconductor layer 101 with its surface atomic arrangement texture of (2×2). <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2006303418(A) |
申请公布日期 |
2006.11.02 |
申请号 |
JP20050341423 |
申请日期 |
2005.11.28 |
申请人 |
DOSHISHA;SHOWA DENKO KK |
发明人 |
OHACHI TADASHI;UDAGAWA TAKASHI |
分类号 |
H01L21/205;C23C14/06;C23C14/22;C23C16/30;C30B23/08;H01L21/203;H01L33/06;H01L33/32;H01L33/34 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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