发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME |
摘要 |
<p>A semiconductor device includes a first conductivity type SiC semiconductor substrate; a second conductivity type well formed on the SiC semiconductor substrate; a first impurity diffused layer formed by introducing a first conductivity type impurity in a region surrounding the well so as to partially overlap the well; a second impurity diffused layer formed in the well by introducing the first conductivity type impurity in a region at a prescribed interval from the impurity diffused layer; and gate electrodes arranged to face each other by having a gate insulating film in between, in a channel region between the first and the second impurity diffused layers.</p> |
申请公布号 |
WO2006115125(A1) |
申请公布日期 |
2006.11.02 |
申请号 |
WO2006JP308136 |
申请日期 |
2006.04.18 |
申请人 |
ROHM CO., LTD.;MIURA, MINEO |
发明人 |
MIURA, MINEO |
分类号 |
H01L29/78;H01L21/336;H01L29/12 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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