| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device which can detect the abnormal heating of a power transistor with high sensitivity. SOLUTION: The temperature protecting circuit of the semiconductor integrated circuit device 10 comprises a first voltage detecting means (sense resistor Rs, amplifier AMP1) which detects a first voltage signal Va correspoding to a monitor current i/n, a second voltage detecting means (amplifier AMP2) which detects a second voltage signal Vb corresponding to the opposite end voltages Von of the power transistor N1, and a comparator CMP2 which compares the first and the second voltage signals Va, Vb, wherein the output signal of the comparator CMP2 is output as a temperature protection signal Stsd. COPYRIGHT: (C)2007,JPO&INPIT
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