| 摘要 |
A surface roughness/contour profile measuring instrument capable of automatic movement of a pickup to a measurement position has been disclosed. The surface roughness/contour profile measuring instrument comprises a pickup and a pickup moving mechanism and measures the surface roughness or the contour profile of the surface of a work, and further comprises a movement information generation section for generating movement information necessary to move the pickup from the current position to the measurement position for detecting the height of a surface position on the work surface and a movement control section for relatively moving the pickup with respect to the work based on the movement information generated by the movement information generation section.
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