Embedded MCU for high speed testing by memory emulation module and test method thereof,申请号KR20040000366-传众专利搜索

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发明名称	Embedded MCU for high speed testing by memory emulation module and test method thereof
摘要
申请公布号	KR100640579(B1)	申请公布日期	2006.10.31
申请号	KR20040000366	申请日期	2004.01.05
申请人		发明人
分类号	G06F11/22;G01R31/28;G06F11/00;G06F11/26;G11C29/00;G11C29/48	主分类号	G06F11/22
代理机构		代理人
主权项
地址

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