发明名称 |
Dual gate multi-bit semiconductor memory |
摘要 |
A method for altering and reading the contents of a memory cell includes the steps of: applying programming voltages to a first control gate and to a second control gate to cause carriers to be injected and trapped in either a first charge trapping region or in a second charge trapping region; applying erasing voltages to the first control gate and to the second control gate to cause the trapped carriers to be removed from the first charge trapping region and/or the second charge trapping region; and applying a sequence of reading voltages to the first control gate and to the second control gate for determining a state of each of the first and the second charge trapping regions.
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申请公布号 |
US7130221(B1) |
申请公布日期 |
2006.10.31 |
申请号 |
US20050234983 |
申请日期 |
2005.09.26 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
HO CHIAHUA;LUE HANG-TING |
分类号 |
G11C11/34 |
主分类号 |
G11C11/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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