发明名称 |
Reliability based characterization using bisection |
摘要 |
In accordance with the present invention there is provided a method for determining an optimized parameter for a circuit simulation. A circuit path for the simulation is determined, and maximum and minimum optimization parameters are decided. Next, the circuit path is simulated using the maximum optimization parameter. The circuit path is simulated using the minimum optimization parameter and a primary criteria parameter is also calculated. The simulations are compared to determine whether the same status (both succeed or both fail) is generated for both the minimum optimization parameter and the maximum optimization parameter. If the simulations do not indicate the same status, then the optimization parameter is recalculated and the circuit is simulated until the primary criteria parameter converges to a prescribed value.
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申请公布号 |
US7131088(B2) |
申请公布日期 |
2006.10.31 |
申请号 |
US20030729697 |
申请日期 |
2003.12.05 |
申请人 |
LEGEND DESIGN TECHNOLOGY, INC. |
发明人 |
WEI YOU-PANG;LIAO YUHUNG;LIU MINGCHI;PING YUJIAO |
分类号 |
G06F17/50;G06F9/45 |
主分类号 |
G06F17/50 |
代理机构 |
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地址 |
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