| 摘要 |
A test device for electrical testing of a unit under test, the device having a contact head which can be associated with the unit under test and is provided with contact elements pins in a contact pin arrangement, having an electrical connecting apparatus, including contact surfaces which make touching contact with first ends of the contact elements which face away from the test plane accommodating the unit under test, and having a supporting apparatus which is arranged on the side of the connecting apparatus facing away from the contact head. Pulling or pushing devices adjust the planar condition or a desired discrepancy from the planar condition of an arrangement of the contact surfaces and those devices are arranged between the supporting apparatus and the connecting apparatus.
|
