发明名称 INSPECTION METHOD OF PRINTED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To improve inspection problem in which in a method of inspecting a printed circuit up to now, a checking error is never avoided in visual inspection because a reflection of blue component is strong even if regular black light is used, therefore, a test piece becomes very difficult to see. SOLUTION: In an inspection method of the printed circuit, a light having a wavelength of invisible region is irradiated; the light is ultraviolet rays; the ultraviolet rays have a wavelength of region not containing the blue component; the light is irradiated from upper, lower, and side hoop directions, an irradiation of the light is performed by combining a source of luminescence and optical system elements such as lens, prism, and mirror; and the irradiation of the light is performed by switching two or more wavelengths different from each other. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006295036(A) 申请公布日期 2006.10.26
申请号 JP20050116802 申请日期 2005.04.14
申请人 WORLD TECHNO:KK 发明人 ISHIWATARI KIWA
分类号 H05K3/00;G01N21/84;G01N21/956 主分类号 H05K3/00
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