Test piece shape, roughness and surface span determining device has scanning equipment with elliptical scanning surface, which extends in direction of principal axis of test piece or transverse to main movement direction

摘要

The device has a scanning equipment (50) with an elliptical scanning surface that is displaced in horizontal and vertical axes relative to a test piece (10) for scanning the test piece in a punctiform manner. The surface extends in a direction of a principal axis of the test piece or transverse to a main movement direction. An optical path for generation of the surface is determined by the design of an optical unit in the equipment. An independent claim is also included for a method for determining the shape, roughness and surface span of a test piece.