发明名称 REFRACTION MEASURING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a refraction measuring apparatus capable of recognizing the position of a fixation target to be presented. <P>SOLUTION: This refraction measuring apparatus is provided with a measuring means measuring the refraction of an eye to be examined, a presentation position changing means changing the presentation position of the visual target presented to the eye to be examined in the optical axis direction, a display means displaying the presentation position of the visual target moving by the presentation position changing means, and a display control means determining the far point of the eye to be examined based on the refraction measured by the measuring means, graphically displaying the far point position on the display means, and graphically displaying a presentation position of the visual target to be changed from the far point position by the presentation position changing means as a change in diopter value. The display control means graphically displays a near position positioned near by a prescribed diopter from the determined far point position on the display means. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006280614(A) 申请公布日期 2006.10.19
申请号 JP20050104610 申请日期 2005.03.31
申请人 NIDEK CO LTD 发明人 SHIMIZU KAZUNARI;BAN YUKINOBU;KAWAI TOSHIYUKI
分类号 A61B3/10;A61B3/09 主分类号 A61B3/10
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