发明名称 Electromigration barrier layers for solder joints
摘要 A microelectronic package is disclosed including a microelectronic device, a substrate, and a signaling path coupling the microelectronic device with the substrate. The signaling path includes a conductive material, a solder joint, and a barrier material disposed between the conductive material and the solder joint. The barrier material may include nickel, cobalt, iron, titanium, and combinations thereof.
申请公布号 US7122460(B2) 申请公布日期 2006.10.17
申请号 US20040890684 申请日期 2004.07.13
申请人 INTEL CORPORATION 发明人 HUA FAY
分类号 H01L21/44;H01L21/48;H01L21/50;H01L21/60;H01L23/485;H01L23/498;H05K3/34 主分类号 H01L21/44
代理机构 代理人
主权项
地址