发明名称 DEPOSITION METHOD AND DEPOSITION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a deposition method and a deposition device capable of suppressing the fluctuation of a deposition rate between the process of continuous deposition and the process of spacing deposition, and capable of stably depositing a fixed film thickness. SOLUTION: A pressure inside a reaction chamber 2 to which a substrate 10 to be processed is carried in is turned to the pressure lower than a deposition pressure first. Then, an inert gas is supplied into the reaction chamber 2, and the inside of the reaction chamber 2 is turned to the almost same pressure as the deposition pressure. Then, while reducing the flow rate of the inert gas to be supplied to the reaction chamber 2, a raw material gas is supplied into the reaction chamber 2 while increasing the flow rate, and the film is formed on the substrate 10 to be processed while maintaining the pressure inside the reaction chamber 2 at the deposition pressure. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006278800(A) 申请公布日期 2006.10.12
申请号 JP20050096660 申请日期 2005.03.30
申请人 SONY CORP 发明人 FUJITA SHIGERU
分类号 H01L21/205;C23C16/52 主分类号 H01L21/205
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