发明名称 Dual stage lithographic apparatus and device manufacturing method
摘要 <p>The invention relates to a dual stage lithographic apparatus, wherein to substrate stages are constructed and arranged for mutual cooperation in order to perform a joint scan movement (71) for bringing the lithographic apparatus from a first situation, wherein immersion liquid (66) is confined between a first substrate (14) held by the first stage (42.1) of the said stages and a final element (70) of a projection system (18) of the apparatus, towards a second situation, wherein the said liquid is confined between a second substrate (14) held by the second stage (42.2) of the two stages and the final element, such that during the joint scan movement the liquid is essentially confined within said space with respect to the final element.</p>
申请公布号 EP1710629(A2) 申请公布日期 2006.10.11
申请号 EP20060075836 申请日期 2006.04.07
申请人 ASML NETHERLANDS BV 发明人 LOOPSTRA, ERIK ROELOF;BENSCHOP, JOZEF PETRUS HENRICUS;VAN DEN BRINK, MARINUS AAERT
分类号 G03F7/20 主分类号 G03F7/20
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