发明名称 |
Nanoparticle ion detection |
摘要 |
A nanoparticle ion detector includes an ion trap that receives charged particles ejected from a mass selection device. A laser beam illuminates the particles to induce fluorescence, which is detected by the photon detector. Particles are periodically dumped from the ion trap. A mass spectrum of the charged particles can be obtained by comparing signals from the photon detector with the particle ejection characteristics of the mass selection device.
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申请公布号 |
US7119331(B2) |
申请公布日期 |
2006.10.10 |
申请号 |
US20030726071 |
申请日期 |
2003.12.01 |
申请人 |
ACADEMIA SINICA |
发明人 |
CHANG HUAN-CHENG;PENG WEN-PING;CAI YONG |
分类号 |
B01D59/44;H01J49/16;H01J49/42 |
主分类号 |
B01D59/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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