发明名称 Lithographic apparatus and device manufacturing method
摘要 A lithographic apparatus includes an illumination system for providing a beam of radiation and a support structure for supporting a patterning device. The patterning device serves to impart the beam with a pattern in its cross-section. The lithographic apparatus includes a substrate table for holding a substrate and a projection system for projecting the patterned beam onto a target portion of the substrate. The apparatus has a chuck system for supporting an object, such as the substrate or the patterning device, in the lithographic apparatus. The chuck system includes a chuck for supporting the object, a frame for supporting the chuck, and a chuck support structure for supporting the chuck relative to the frame. The chuck support structure includes at least one flexure element, which flexure element is flexible in at least one degree of freedom and is coupled to the chuck and the frame.
申请公布号 US7119884(B2) 申请公布日期 2006.10.10
申请号 US20030744088 申请日期 2003.12.24
申请人 ASML NETHERLANDS B.V. 发明人 OTTENS JOOST JEROEN;GILISSEN NOUD JAN;STARREVELD JEROEN
分类号 G03B27/58;G03B27/62;G03F7/20;H01L21/67;H02N13/00 主分类号 G03B27/58
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