发明名称
摘要 PROBLEM TO BE SOLVED: To perform defect inspection with high reliability, while processing at high compression rate and high speed, and making missing of defective pixel difficult to occur. SOLUTION: A set of data corresponding to a plurality of pixels in a prescribed section S is compressed to one data 1a3 for the display characteristic data 1a2 of each pixel, and the each compressed data 1a3 is handled as a compression image data D1, and the like arranged according to the position of corresponding compression element. The compression image data D1 is obtained for each shift conditions to a plurality of positions satisfying the conditions that a part of pixels in same section S exists, while being overlapped at a position for specifying the section S to be compressed. Corresponding compression data 1a3 of the compression image data D1-D4 under each shift conditions are combined into one compression data 1a4 to be judged which is then compared with a reference data thus detecting defects.
申请公布号 JP3829024(B2) 申请公布日期 2006.10.04
申请号 JP19990025158 申请日期 1999.02.02
申请人 发明人
分类号 G01M11/00;H01J9/42;G01N21/88;G02F1/13;G06T1/00;G06T7/00;G09F9/00;G09G1/00;G09G3/20 主分类号 G01M11/00
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