发明名称 |
Imaging inspection apparatus |
摘要 |
<p>An imaging inspection apparatus (21) which utilizes a plurality of individual imaging inspection devices (23) (e.g., X-ray Computer Tomography scanning devices) positioned on a frame (53) for directing beams onto articles having objects therein to detect the objects based on established criteria. The apparatus utilizes a conveyor (31) which is not physically coupled to the frame (53) having the imaging inspection devices (23) to pass the articles along a path of travel to an inspection location within the apparatus, whereupon the inspection devices (23) direct beams onto the article and the beams are detected and output signals provided to a processing and analysis assembly which analyzes the signals and identifies certain objects which meet the criteria. The conveyor can be folded when it is not conveying said articles.</p> |
申请公布号 |
EP1707947(A1) |
申请公布日期 |
2006.10.04 |
申请号 |
EP20060251553 |
申请日期 |
2006.03.23 |
申请人 |
SURESCAN CORPORATION |
发明人 |
CHAPIN, FLETCHER L.;KOZOL, JOHN E. |
分类号 |
G01N23/04;B65G21/14;G01V5/00 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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