发明名称 Imaging inspection apparatus
摘要 <p>An imaging inspection apparatus (21) which utilizes a plurality of individual imaging inspection devices (23) (e.g., X-ray Computer Tomography scanning devices) positioned on a frame (53) for directing beams onto articles having objects therein to detect the objects based on established criteria. The apparatus utilizes a conveyor (31) which is not physically coupled to the frame (53) having the imaging inspection devices (23) to pass the articles along a path of travel to an inspection location within the apparatus, whereupon the inspection devices (23) direct beams onto the article and the beams are detected and output signals provided to a processing and analysis assembly which analyzes the signals and identifies certain objects which meet the criteria. The conveyor can be folded when it is not conveying said articles.</p>
申请公布号 EP1707947(A1) 申请公布日期 2006.10.04
申请号 EP20060251553 申请日期 2006.03.23
申请人 SURESCAN CORPORATION 发明人 CHAPIN, FLETCHER L.;KOZOL, JOHN E.
分类号 G01N23/04;B65G21/14;G01V5/00 主分类号 G01N23/04
代理机构 代理人
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