发明名称 DEVELOPMENT DEVICE AND DEVELOPMENT METHOD
摘要 A developer nozzle is moved from a periphery of a wafer toward the central portion while an exposed substrate held at a spin chuck is being rotated about a vertical axis and while a developing solution is being discharged from the developer nozzle, and this way the developing solution is supplied to the surface of the wafer, the developer nozzle having a slit-like ejection port whose longitudinal direction is oriented to the direction perpendicular to the radial direction of the wafer. The movement speed of the nozzle is higher than a case where a nozzle with a small-diameter circular nozzle is used, and this enables a development time to be reduced. Further, the thickness of a developing solution on a substrate can be reduced, so that the developing solution can be saved.
申请公布号 EP1708252(A1) 申请公布日期 2006.10.04
申请号 EP20040807773 申请日期 2004.12.24
申请人 TOKYO ELECTRON LTD. 发明人 OOKOUCHI, ATSUSHI;YAMAMOTO, TARO;TAKEGUCHI, HIROFUMI;KYOUDA, HIDEHARU;YOSHIHARA, KOUSUKE
分类号 G03F7/30;H01L21/00;H01L21/027 主分类号 G03F7/30
代理机构 代理人
主权项
地址