发明名称 |
Mass spectroscope and method of calibrating the same |
摘要 |
An ion resonance condition is corrected accurately in an ion trapping device. Measurements are repeated by alternately applying and not applying a resonance frequency voltage while spectral data is obtained continuously. Data obtained in the absence of the resonance frequency voltage is used as reference data to correct the set data of a resonance condition. As a result, calibration can be made while taking into consideration the variations in the amount of ions that are introduced into the ion trap.
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申请公布号 |
US7115862(B2) |
申请公布日期 |
2006.10.03 |
申请号 |
US20040018375 |
申请日期 |
2004.12.22 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
NAGAI SHINJI;YASUDA HIROYUKI;NISHIDA TETSUYA |
分类号 |
B01D59/44;G01N27/62;G01D18/00;G12B13/00;H01J49/00;H01J49/40;H01J49/42 |
主分类号 |
B01D59/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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