发明名称 Organosilicate resins as hardmasks for organic polymer dielectrics in fabrication of microelectronic devices
摘要 This invention is a method comprising providing a substrate, forming a first layer on the substrate, wherein the first layer has a dielectric constant of less than 3.0 and comprises an organic polymer, applying an organosilicate resin over the first layer, removing a portion of the organosilicate resin to expose a portion of the first layer, and removing the exposed portions of the first layer. The invention is also an integrated circuit article comprising an active substrate containing transistors and an electrical interconnect structure containing a pattern of metal lines separated, at least partially, by layers or regions of an organic polymeric material having a dielectric constant of less than 3.0 and further comprising a layer of an organosilicate resin above at least one layer of the organic polymer material.
申请公布号 US7115531(B2) 申请公布日期 2006.10.03
申请号 US20010933535 申请日期 2001.08.20
申请人 DOW GLOBAL TECHNOLOGIES INC. 发明人 SHAFFER, II EDWARD O.;HOWARD KEVIN E.;WAETERLOOS JOOST J. M.;HETZNER JACK E.;TOWNSEND, III PAUL H.;MILLS LYNNE K.;GOMBAR-FETNER SHEILA;WILSON LARRY R.
分类号 G03F7/075;H01L21/469;C08G77/20;G03F7/11;H01L21/027;H01L21/033;H01L21/31;H01L21/311;H01L21/312;H01L21/314;H01L21/768 主分类号 G03F7/075
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