发明名称 INSPECTION METHOD USING SCANNING LASER SQUID MICROSCOPE AND INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a non-destructive inspection method capable of narrowing a troubled place, and an inspection device. SOLUTION: The images of magnetic field distributions obtained by scanning the laser beam respectively thrown on first and second samples are acquired (first step) and, when there is a difference between the images of the magnetic field distributions, current images are respectively acquired from the magnetic field distributions acquired by scanning the first and second samples by a magnetic field sensor in a state that the predetermined places of the first and second samples are irradiated with the laser beam (second step). The difference between the current images is taken to discriminate the difference between the current routes related to the predetermined places of the first and second samples from the difference image. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006258479(A) 申请公布日期 2006.09.28
申请号 JP20050073309 申请日期 2005.03.15
申请人 NEC ELECTRONICS CORP 发明人 FUTAGAWA KIYOSHI
分类号 G01N27/82;H01L21/66 主分类号 G01N27/82
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