| 摘要 |
PROBLEM TO BE SOLVED: To enable open short check between arbitrary terminals of a semiconductor integrated circuit. SOLUTION: In confirming whether an external terminal A2 short-circuits with an external terminal A1 or external terminal A3, respective logical values of first test input signals provided to first test signal input terminals B1-B3 are set at "1", "0" and "1", respective logical values of input signals inputted into the external terminals A1-A3 are set at "1", "0" and "1", the logical value of second test input signal provided to a second test signal input terminal B4 is set at "1", and the logical value of a test signal output terminal C1 is determined. COPYRIGHT: (C)2006,JPO&NCIPI
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