| 摘要 |
The object of this invention is to realize a test system capable of conducting measurement at high precision. This invention improves a test system by which a tested object conducting current output is tested. The device according to this invention is characterized by including: a current measuring section that measures an output of the tested object; a current generating section, provided between the current measuring section and the tested object, that supplies an inverting current based on an expect value of output of the tested object. |
