SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of executing the operation time power supply current test of a prescribed operation in the state that a ROM 1320 performs a read operation even when the instruction code of an operation program is arranged in a RAM 1320 and a CPU 1310 reads the instruction code from the RAM 1310.

SOLUTION: By providing a ROM control part 1340 for enabling test mode signals and turning the ROM 1320 to a read operation state simultaneously with the instruction code read operation of the RAM 1330, the operation time power supply current test of the prescribed operation is performed in the state of performing the read operation of the ROM 1320.

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