发明名称 PHOTORESIST TOPCOAT FOR PHOTOLITHOGRAPHIC PROCESS
摘要 <P>PROBLEM TO BE SOLVED: To provide a photoresist topcoat extremely suitable for photolithography and a liquid immersion photolithographic system. <P>SOLUTION: The topcoat consists of a composition including functionalized polyhedral oligomeric silsesquioxane derivatives of formulae T<SB>m</SB><SP>R3</SP>, wherein m is equal to 8, 10 or 12 and Q<SB>n</SB>M<SB>n</SB><SP>R1, R2, R3</SP>, (wherein n is equal to 8, 10, 12). The functional groups preferably include aqueous base soluble moieties. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006251794(A) 申请公布日期 2006.09.21
申请号 JP20060048025 申请日期 2006.02.24
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 RATONAMU SOORIYAKUMARAN;SUNDBERG LINDA KARIN;ALLEN ROBERT DAVID
分类号 G03F7/11;C08G77/38;C09D183/04;C09D183/05;C09D183/08;C09D183/10;G03F7/075;H01L21/027 主分类号 G03F7/11
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