发明名称 Process for fabricating high aspect ratio embossing tool and microstructures
摘要 A tool for embossing high aspect ratio microstructures is provided, wherein the microstructures provide decreased surface reflection and increased transmission through an optical component even at high incident angles. The tool is fabricated by a process that comprises anisotropic etching of columnar pits in a silicon substrate using inductively coupled plasma, followed by isotropic reactive ion etching of the columnar pits to create relatively pointed obelisks. The silicon substrate is then preferably rinsed to remove remaining photoresist prior to vapor depositing a conductive layer thereon. Finally, a metal is electroformed over the conductive layer to form the embossing tool. The embossing tool is then pressed against an optical coating, for example a polymer sheet, to create microstructures having aspect ratios from 1 to 5.
申请公布号 US7108819(B2) 申请公布日期 2006.09.19
申请号 US20030439503 申请日期 2003.05.16
申请人 THE BOEING COMPANY 发明人 HARKER ALAN B;DENATALE JEFFREY F;STRAUSS DENNIS R
分类号 B29C33/38;B44B5/00;B44C1/24;B81C1/00;C25D7/00;G02B1/10 主分类号 B29C33/38
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